Rapid Chemical Mapping at the Nanometre Spatial Resolution Scale - Photoinduced Force Measurement
Vista IR
© Acutance Scientific Ltd 2011 - 2018

For more detailed information on the Molecular Vista-IR PiFM, contact Acutance at sales@acutance.co.uk 

or on +44 (0)1892 300 400.

Very Rapid IR Chemical Mapping at the <10nm Spatial Resolution Scale - Vista-IR PiFM

This new and disruptive technology is brought by Molecular Vista, co- founded by Molecular Vista was founded by two industry veterans, Prof. Kumar Wickramasing he (UC Irvine and formerly with IBM Research) and Dr. Sung Park (co-founder of Park Scientific Instruments).
Acutance Scientific Ltd Logo / Banner
Acutance Scientific Ltd logo / banner
Nanometre-scale infrared spectroscopic mapping is achievable quickly and routinely on a wide variety of samples. Vista-IR uses an oscillating AFM cantilever to very sensitively detect polarization-induced forces between tip and sample resulting from wavelength-dependent IR absorption. A Mid IR range (800-1800 cm-1 or 5-13 μm) Quantum Cascade Laser (QCL) is employed for spectroscopic imaging. nm-scale resolution is achieved with excellent Signal-to-Noise and speed via mechanical detection (no need to collect scattered photons or respond to temperature changes). Spatial resolution does not vary with sample thermal properties or thickness.
Polystyrene (Red) and Polyethylene (Green) 3mm x 3mm 3D topography overlaid with chemical information
Chemical Map by PiFM of inhomogeneous Polystyrene Polyethylene structure

PiFM Features

Vista-IR Photoinduced Force Measurement Vista-IR from Molecular Vista and Acutance Scientific
E & OE

5x5micron PiFM of PS-b-PMMA Block Copolymer

Chemical Map by PiFM of PS-b-PMMA Block Copolymer
•Works with both Transparent and Opaque substrates •Non-contact and Tapping Method •Standard off-the-shelf cantilever •Works in visible and mid-IR spectrum •Simplified optical setup with no far-field background signal •Tip-to-tip reproducibility •Spatial resolution < 10 nm •Other standard scanning probe techniques are provided: Conductive AFM, Electric Force Microscopy , Kelvin Probe Force Microscopy •Options are available to combine far-field (Raman, Photoluminescence) and near-field photon collection techniques (TERS, sSNOM)