For the ultimate performance in repeatable trace analysis, quantification, compositional mapping and reliability - CAMECA EPMA
Electron Probe
© Acutance Scientific Ltd 2011 - 2017
Where trace-analysis or highly-dependable and accurate quantification are needed, especially with compositional mapping down to a small fraction of a micron, EPMA is the tool of choice in materials and earth sciences. Critical elements of such an instrument are stability, reliability and raw performance. CAMECA’s EPMAs uniquely have closed-loop beam control for stability, such that beam current has been measured to have standard deviation of just 0.007nA on a 20nA beam current over a period of 2 hours, 0.009nA over 12hours. This, together with similar obsessive attention to detail throughout the design, deliver the extraordinary stabilty results opposite.  
What makes the best Electron Probe?

SXFive FE Field Emission measurements repeated over  81



Not only were the WDS analyzers NOT recalibrated over the entire 81 days of this measurement, but also after each measurement the sample was removed from the Electron Probe in order to free it to perform other measurements. One reason for the result is that the WDS analyzers are hard-geared (no bands) and have optically-encoded feedback. This design attention to repeatability and reliability has made the CAMECA EPMAs the benchmark for the technique.

CAMECA SXFive and SXFiveFE - the ultra non plus in EPMA quality and stability


CAMECA Electron Probes were first manufactured back in the 1950s. The first EPMA was developed in 1955 by Pr Raymond Castaing and the first production CAMECA EPMA made in 1958. A long succession of CAMECA Electron Probes over the decades has built the reputation of the CAMECA Electron Probe as the global benchmark.

For more detailed information on the above data, or further information on the CAMECA SXFive and SXFiveFE EPMA,

contact Acutance at or on +44 (0)1892 300 400.

CAMECA Science and Metrology Solutions - SIMS, Atom Probe Tomography, Electron Probe for Material Analysis
E & OE

High spatial resolution

analysis of complex Fe-Ti


Shown here are X-Ray images of a composite Fe-Ti oxide grain at high spatial resolution from a metasomatized peridotite xenolith.
An original Nb-bearing rutile was overgrown and partially replaced by ilmenite, with a later Fe-oxide rim developed on the ilmenite. The profile plot of Fe and Ti X-ray intensities taken along the red overlay line demonstrates a lateral resolution of 300nm. Data acquired with the CAMECA SXFiveFE at 6kV, 50nA. Sample courtesy of F. Kalfoun, D. Ionov, C. Merlet.
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