Acutance Scientific Ltd for Electron Probe EPMA, IMS SIMS, 3D Atom Probe Tomography, High Angular Resolution EBSD, Programmable Nanorobotics and 3D Optical Profiling
Welcome!  Acutance Scientific Ltd 2011 - 2017
Acutance Scientific - innovative compositional analysis, electron microscopy and 3D profiling
Not from Dolce and Gabbana.....

Out in front

Acutance Scientific brings the most innovative tools in compositional analysis to the market. From mapping the full distortion tensor and Geometrically Necessary Dislocations at the Electron Microscope resolution to 3D Atom Probe Tomography, here is a combination of instruments of the future and quality/performance benchmarks. It is only possible to give a very limited presentation of the capabilities of these instruments on this website - please contact us for further details.

Understanding your project and experiment

Our first objective is always to understand the experimental aim and requirements for a desired project. Our second objective is to provide you with all the information you need to make your own informed evaluation. If we don’t think we can recommend a solution we’ll say so and aim to point you in the direction of somebody who can. With considerable experience of the techniques, data deliverables and the hidden pitfalls for the unwary, our main aim is to ensure that any solution recommended really does the job. A long track record in compositional analysis instrumentation design for nanotechnology helps too. If you think your desired experiment in our technical neck of the woods is impossible, then run it past us before drawing any conclusions......

Innovative Electron

Microscope Accessories

Acutance Scientific offers a range of enabling technologies, from High Anngular Resolution EBSD for mapping the full distortion tensor at electron microscope resolutions, to user- programmable and sensing micromanipulator / nanorobot integrated systems and nanorobot microrobot production lines.

Electron Probe for

Materials Analysis

CAMECA launched its first EPMAin the 1950s, and has set the benchmark ever since. Ion Magnetic Sector SIMS (Secondary Ion Mass Spectrosopy/Ion Probe) Simultaneous high transmission and high mass resolution are one of the hallmarks of the CAMECA SIMS product lines, which set the benchmark in the top university  earth-, cosmochemistry- and materials-laboratories across the world. Now high spatial resolution NanoSIMS enables ground-breaking research in life sciences.
Acutance Scientific Ltd logo / banner High Angular Resolution EBSD map of one Partial Rotation Gradient tensor element (δW31/δx) from a Titanium sample on the Electron Microscope scale. Data courtesy of Dr Ben Britton, Imperial College London. Click for more. V-Defect in Quantum Well. mapped by CAMECA Atom Probe. Arsenic atoms forming rings in a Cottrell Atmoshere around a circle defect, mapped by CAMECA LEAP. Click for more. For more on Zeta 3D Optical Profilers, click here. Acutance Scientific Ltd logo / banner